External signals can be connected and added to the output signal.
Tektronix function generator afg3102.
See more signal generators discover how tektronix s new afg31000 makes testing even easier with a 9 inch touchscreen display built in waveform creation tool real time waveform monitoring and much more.
The afg31000 is the first function generator on the market that includes built in double pulse test software.
Arbitrary waveforms can be generated up to 128 k in length at high sampling rates.
Afg3022 afg3101 afg3102 afg3251 afg3252 related product information.
A large display and 25 shortcut keys make the afg3000c series arbitrary function generator both easy to learn and easy to use.
With standard waveforms arbitrary waveform capability and signal impairment options a tektronix function generator supports a wide range of application needs with one instrument.
Tektronix afg3102c 100 mhz dual channel 1 gs s arbitrary function generator with 3 9 inch color tft lcd display at the test equipment depot home tektronix function generators afg3102c tektronix afg3102c 100 mhz dual channel 1 gs s arbitrary function generator with 3 9 inch color tft lcd display.
Superior performance and versatility users can choose from 12 different standard waveforms.
Please specify power plug when ordering.
This document supports firmware version 2 0 0 and above.
A large display and 25 shortcut keys make the afg3000 series arbitrary function generator both easy to learn and easy to use.
Tektronix hereby grants permission and license to owners of tektronix instruments to download and reproduce the manuals on this website for.
Arbitrary function generator service manual.
With the tektronix afg3102 and afg 3101 users can choose from 12 different standard waveforms.
Afg3000c arbitrary function generator.
Arbitrary waveforms can be generated up to 128 k in length at high sampling rates.
On pulse waveforms leading and trailing edge time can be set independently.
No need for an external pc application or manual programming.
See the new afg31000 today s designs are often complex demanding a variety of stimulus signals during test.